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Long-Term Trend Analysis for the Spectral Irradiance Monitor (SIM) and the Solar Radiation and Climate Experiment (SORCE)

Anne Ellis

The Solar Radiation and Climate Experiment (SORCE) mission of NASA is equipped with four instruments, one of which is the X-ray Photometer System (XPS). Key measurements of Total Solar Irradiance (TSI) and Solar Spectrum Irradiance were made by the SORCE spacecraft between 2003 and 2020. (SSI). The XPS is a collection of photometers used to gauge the sun's X-Ray Ultraviolet (XUV) irradiance at wavelengths less than 34 nm and the strong hydrogen emission at 121.6 nm. The accuracy of the XPS measurements is roughly 20%, and each photometer has a spectral bandpass of about 7 nm. Updates to the final data-processing algorithms are presented for the XPS solar-irradiance data products. Improvements to the instrumental adjustments for background signal, visible-light signal, and deterioration trends are included in these processing revisions. The Solar Radiation and Climate Experiment/Spectral Irradiance Monitor (SORCE/SIM) instrument was launched on January 25, 2003, and its mission will end on February 25, 2020. The SORCE/SIM offers a singular data set of the variability in Solar Spectral Irradiance (SSI) throughout the descending portion of Solar Cycle 23 (SC23) from April 2003 to February 2009, the weaker solar-maximum circumstances of SC24, and the quiet SC24/SC25 low. The unmistakable identification of the impacts of the space environment and solar-exposure-related degradation mechanisms is necessary for the assessment of the size and phase of SSI fluctuations. The instrument-only SIM adjustments are based on a comparison of two functionally identical (mirror image) prism spectrometers with four independent detectors in each spectrometer channel.